Dr. Sen Deng
National Institute of Metrology
Dr. Sen Deng received the Ph.D. degree in Instrument Science and Technology from Harbin Institute of Technology, China, in 2026. He is currently an Assistant Researcher (Asst. Prof.) with the National Institute of Metrology, Beijing, China. He serves as a reviewer for IEEE Transactions on Instrumentation and Measurement and IEEE Transactions on Industrial Electronics. He has published peer-reviewed papers as the first author in leading journals such as International Journal of Mechanical Sciences, NDT & E International and Measurement, and holds two granted Chinese invention patents on high-precision ultrasonic stress measurement and high-resolution defect imaging. His research interests include laser ultrasonics, electromagnetic acoustic transducers, and ultrasonic metrology for stress measurement.